发明名称 Junction barrier Schottky diode and manufacturing method thereof
摘要 The present invention discloses a junction barrier Schottky (JBS) diode and a manufacturing method thereof. The JBS diode includes: an N-type gallium nitride (GaN) substrate; an aluminum gallium nitride (AlGaN) barrier layer, which is formed on the N-type GaN substrate; a P-type gallium nitride (GaN) layer, which is formed on or above the N-type GaN substrate; an anode conductive layer, which is formed at least partially on the AlGaN barrier layer, wherein a Schottky contact is formed between part of the anode conductive layer and the AlGaN barrier layer; and a cathode conductive layer, which is formed on the N-type GaN substrate, wherein an ohmic contact is formed between the cathode conductive layer and the N-type GaN substrate, and the cathode conductive layer is not directly connected to the anode conductive layer.
申请公布号 US9105757(B2) 申请公布日期 2015.08.11
申请号 US201314040670 申请日期 2013.09.28
申请人 Richtek Technology Corporation, R.O.C. 发明人 Huang Chih-Fang;Huang Tsung-Yi;Chiu Chien-Wei;Yang Tsung-Yu;Chang Ting-Fu;Hsiao Tsung-Chieh;Liu Ya-Hsien;Peng Po-Chin
分类号 H01L29/872;H01L29/66;H01L29/868;H01L29/06;H01L29/20;H01L29/205 主分类号 H01L29/872
代理机构 Tung & Associates 代理人 Tung & Associates
主权项 1. A junction barrier Schottky (JBS) diode comprising: an N-type gallium nitride (GaN) substrate; an aluminum gallium nitride (AlGaN) barrier layer, which is formed on the N-type GaN substrate; a P-type gallium nitride (GaN) layer, which is formed on the AlGaN barrier layer or on the N-type GaN substrate; an anode conductive layer, which is formed at least partially on the AlGaN barrier layer, wherein a Schottky contact is formed between part of the anode conductive layer and the AlGaN barrier layer; and a cathode conductive layer, which is formed on the N-type GaN substrate, wherein an ohmic contact is formed between the cathode conductive layer and the N-type GaN substrate, and the cathode conductive layer is not directly connected to the anode conductive layer; wherein the P-type GaN layer is formed on the AlGaN barrier layer, and the P-type GaN layer and the N-type GaN substrate are separated by the AlGaN barrier layer; wherein a Schottky diode is formed by the anode conductive layer, the AlGaN barrier layer, the N-type GaN substrate, and the cathode conductive layer; wherein a PIN diode is formed by the P-type GaN layer, the AlGaN barrier layer, and the N-type GaN substrate; wherein the Schottky diode and the PIN diode are connected in parallel.
地址 Chupei, HsinChu TW