Electron beam diagnostic system using computed tomography and an annular sensor

摘要

A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.

主权项

1. An apparatus for analyzing an electron beam, wherein the electron beam has a central propagation axis, comprising:
an electron beam diagnostic sensor adapted to receive the electron beam; a continuous or segmented circular sensor structure operatively connected to said electron beam diagnostic sensor, wherein said continuous or segmented circular sensor structure has a sensor structure central axis that is arranged coaxially with the electron beam central propagation axis and wherein said continuous or segmented circular sensor structure receives the electron beam; a system for sweeping the electron beam from said sensor structure central axis and the electron beam central propagation axis to and along said continuous or segmented circular sensor structure wherein the electron beam is intercepted by said continuous or segmented circular sensor structure; and a device for measuring the electron beam that is intercepted by said continuous or segmented circular sensor structure.