发明名称 Three-dimensional nonvolatile memory devices including interposed floating gates
摘要 Provided are three-dimensional nonvolatile memory devices and methods of fabricating the same. The memory devices include semiconductor pillars penetrating interlayer insulating layers and conductive layers alternately stacked on a substrate and electrically connected to the substrate and floating gates selectively interposed between the semiconductor pillars and the conductive layers. The floating gates are formed in recesses in the conductive layers.
申请公布号 US9105736(B2) 申请公布日期 2015.08.11
申请号 US201414164408 申请日期 2014.01.27
申请人 Samsung Electronics Co., Ltd. 发明人 Son Byoungkeun;Kim Hansoo;Kim Jinho;Kim Kihyun
分类号 H01L29/66;H01L21/8238;H01L29/788;H01L29/423;H01L29/78;H01L27/115 主分类号 H01L29/66
代理机构 Myers Bigel Sibley & Sajovec, P.A. 代理人 Myers Bigel Sibley & Sajovec, P.A.
主权项 1. A three-dimensional nonvolatile memory device, comprising: a stacked structure including a plurality of conductive layers and insulating layers which are stacked alternately and repeatedly on a substrate; a plurality of channel pillars penetrating the stacked structure to be connected to the substrate; and a plurality of data storage layers disposed between the conductive layers and the channel pillars and surrounding the channel pillars; wherein the data storage layers are vertically and horizontally spaced apart from each other.
地址 KR