发明名称 Impedance calibration circuit and method
摘要 An embodiment includes an impedance calibration circuit having a calibrator configured to compare voltage levels at an external node and an internal node of the impedance calibration circuit and to generate an output based on the comparison. The calibrator further includes respective filters coupled between the external node and a first input of the comparator, and between the internal node and a second input of the comparator. The filters are configured for symmetric noise injection into the comparator from a chip ground line to which a programmable resistor at the internal node is coupled.
申请公布号 US9106219(B2) 申请公布日期 2015.08.11
申请号 US201314075272 申请日期 2013.11.08
申请人 STMicroelectronics International N.V. 发明人 Singh Mayank Kumar;Kumar Daljeet;Advani Hiten
分类号 H04L25/02;G11C7/12;H03K19/003 主分类号 H04L25/02
代理机构 Gardere Wynne Sewell LLP 代理人 Gardere Wynne Sewell LLP
主权项 1. A circuit, comprising: a driver with an adjustable driver impedance; and an impedance calibration circuit, comprising: a comparator configured to compare voltage levels at an external node and an internal node of the impedance calibration circuit and to generate an output based on the comparison;a programmable resistor coupled between the internal node and a chip ground line; andrespective resistor and capacitor components coupled between the external node and a first input of the comparator, and between the internal node and a second input of the comparator;wherein the resistor and capacitor components are coupled to said chip ground line and configured for symmetric noise injection into the comparator from said chip ground line;a counter configured to generate first calibration codes in response to the output for application to control said programmable resistor; anda digital filter circuit configured to filter said first calibration codes to generate second calibration codes for application to control said adjustable driver impedance.
地址 Amsterdam NL