发明名称 |
WAFER PROCESSING APPARATUS HAVING VIBRATION SENSOR |
摘要 |
<p>The purpose of the present invention is to prevent a process accident by detecting a wafer back scratch phenomenon generated when a wafer is processed in advance. A wafer processing apparatus including a vibration detecting sensor according to the present invention relates to a wafer processing apparatus to process the wafer. The wafer processing apparatus comprises: a cup unit where the wafer is held; a base where the cup unit is loaded; a cotter unit including one or more processing spaces having a spraying unit to spray chemicals to the wafer held on the cup unit; and a vibration detecting sensor to detect vibrations caused while processing the wafer held on the cup unit by being included in a predetermined position.</p> |
申请公布号 |
KR101542231(B1) |
申请公布日期 |
2015.08.07 |
申请号 |
KR20150050677 |
申请日期 |
2015.04.10 |
申请人 |
SEMICON TECH GLOBAL LIMITED |
发明人 |
HONG, SOON SUK;KIM, DONG JU;HWANG, MYUNG HWAN |
分类号 |
H01L21/66;H01L21/02;H01L21/683 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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