发明名称 WAFER PROCESSING APPARATUS HAVING VIBRATION SENSOR
摘要 <p>The purpose of the present invention is to prevent a process accident by detecting a wafer back scratch phenomenon generated when a wafer is processed in advance. A wafer processing apparatus including a vibration detecting sensor according to the present invention relates to a wafer processing apparatus to process the wafer. The wafer processing apparatus comprises: a cup unit where the wafer is held; a base where the cup unit is loaded; a cotter unit including one or more processing spaces having a spraying unit to spray chemicals to the wafer held on the cup unit; and a vibration detecting sensor to detect vibrations caused while processing the wafer held on the cup unit by being included in a predetermined position.</p>
申请公布号 KR101542231(B1) 申请公布日期 2015.08.07
申请号 KR20150050677 申请日期 2015.04.10
申请人 SEMICON TECH GLOBAL LIMITED 发明人 HONG, SOON SUK;KIM, DONG JU;HWANG, MYUNG HWAN
分类号 H01L21/66;H01L21/02;H01L21/683 主分类号 H01L21/66
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