| 摘要 |
The present invention provides an X-ray backscattering safety inspection system, comprising: an X-ray source comprising a plurality of target spots each individually controllable to emit X-rays; collimators configured to be respectively passed through the X-ray emitted from the plurality of target spots and output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of an object to be inspected; and N detectors configured to respectively receive scattering signals from the corresponding locations of the object to be inspected, in which N is a positive integer that is great than or equal to 2. The system may achieve double scannings in one scanning operation, which not only increases scanning speed but also enhances backscattering signal for imaging. |
