| 摘要 |
<p>The present invention provides a probe for a high current capable of maintaining a stable low-resistance contact for a long period of time without causing distortion or a fatigue failure. The probe (10) for a high current installs a contact member (14) for electric conduction on a front end (13a) of a base member (13) comprised of a conductive body. The contact member (14) comprises: a fixing unit (14a) fixed while contacting the front end (13a) of the base member (13); and a plurality of leg units (14c) protruding from the fixing unit (14a) in a radial direction. When the contact member (14) is pushed downwards on a target inspection body (30), the plurality of leg units (14c) are pressed by the target inspection body (30) to spread and deform to come into contact with the target inspection body (30). A stopper (15) protrudes on the front end (13a) of the base member (13) to regulate a movement of the contact member (14) towards the target inspection body (30) when the contact member (14) is pushed downwards on the target inspection body (30), and comes into contact with the target inspection body (30).</p> |
