发明名称 IMPROVED INTEGRATED CIRCUIT CONTACT WITH TEST APPARATUS
摘要 The apparatus has contact (18) which is moved between initial orientation position at which contact is disengaged with lead (17) of integrated circuit device (14) and final orientation position, and urged into a slot (20). The sliding of tail end (28) of contact, with respect to terminal (16) of load board (12) is prevented, when contact is moved.
申请公布号 HK1199106(A1) 申请公布日期 2015.08.07
申请号 HK20140112611 申请日期 2014.12.16
申请人 JOHNSTECH INTERNATIONAL CORPORATION 发明人 MATHEW L. GILK ML
分类号 G01R;H01R33/76;G01R1/04;G01R31/26;H01R12/71;H01R13/24;H01R31/06;H01R33/74 主分类号 G01R
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