发明名称 MOUNTED COMPONENT INSPECTION DEVICE
摘要 <p>[Problem] To reduce the inspection time of a mounted component inspection device that photographs a substrate-mounted component from a plurality of directions. [Solution] A mounted component inspection device (1) is provided with cameras (IC, OC1, OC2) for photographing an electronic component (12) from a plurality of directions, common lighting (BL) for irradiating light for photography onto the electronic component (12), and a synchronous control device (30) for synchronously controlling the cameras (IC, OC1, OC2) and the common lighting (BL). The synchronous control device (30) is provided with a lighting control circuit for outputting a lighting signal to the common lighting (BL) that matches the longest exposure time from among the exposure times set for the cameras (IC, OC1, OC2) and a photography control circuit for outputting a photography signal for causing the cameras (IC, OC1, OC2) to execute photography. When a prescribed photography signal is input, a lighting signal is output from the lighting control circuit and the photography signal is synchronously output from the photography control circuit to the camera (IC) having the longest exposure time and the other cameras (OC1, OC2).</p>
申请公布号 WO2015114779(A1) 申请公布日期 2015.08.06
申请号 WO2014JP52120 申请日期 2014.01.30
申请人 YAMAHA HATSUDOKI KABUSHIKI KAISHA 发明人 MAKINO MASAYUKI;SUZUKI MAMORU
分类号 G01N21/956 主分类号 G01N21/956
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