发明名称 |
METHOD AND DEVICE FOR DETERMINING THE X-RAY RADIATION ATTENUATION CAUSED BY THE OBJECT TO BE EXAMINED |
摘要 |
An embodiment of the invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object. Another aspect of an embodiment of the invention is a device, particularly a radiation monitor for an X-ray or CT system, which is suitable for performing the aforementioned procedure according to an embodiment of the invention. |
申请公布号 |
US2015219774(A1) |
申请公布日期 |
2015.08.06 |
申请号 |
US201314420752 |
申请日期 |
2013.07.18 |
申请人 |
Siemens Aktiengesellschaft |
发明人 |
Hannemann Thilo;Reinwand Mario |
分类号 |
G01T1/36;A61B6/00;A61B6/03;G01T1/17 |
主分类号 |
G01T1/36 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for determining an attenuation of x-ray radiation as a result of the x-ray radiation penetrating through an object to be examined, the method comprising:
establishing an intensity of the x-ray radiation, respectively before and after penetrating the object, wherein the spectral composition of the x-ray radiation is determined prior to the x-ray radiation penetrating the object and said spectral composition is taken into account when determining the attenuation, and wherein the spectral composition is determined by establishing the intensity of the x-ray radiation in at least two different energy ranges; calculating a ratio, between the intensity of the x-ray radiation established after the penetration and the intensity of the x-ray radiation established prior to the penetration, for the respectively same energy range; and determining the attenuation using the calculation in the determination of the attenuation. |
地址 |
Munich DE |