发明名称 METHOD AND DEVICE FOR DETERMINING THE X-RAY RADIATION ATTENUATION CAUSED BY THE OBJECT TO BE EXAMINED
摘要 An embodiment of the invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object. Another aspect of an embodiment of the invention is a device, particularly a radiation monitor for an X-ray or CT system, which is suitable for performing the aforementioned procedure according to an embodiment of the invention.
申请公布号 US2015219774(A1) 申请公布日期 2015.08.06
申请号 US201314420752 申请日期 2013.07.18
申请人 Siemens Aktiengesellschaft 发明人 Hannemann Thilo;Reinwand Mario
分类号 G01T1/36;A61B6/00;A61B6/03;G01T1/17 主分类号 G01T1/36
代理机构 代理人
主权项 1. A method for determining an attenuation of x-ray radiation as a result of the x-ray radiation penetrating through an object to be examined, the method comprising: establishing an intensity of the x-ray radiation, respectively before and after penetrating the object, wherein the spectral composition of the x-ray radiation is determined prior to the x-ray radiation penetrating the object and said spectral composition is taken into account when determining the attenuation, and wherein the spectral composition is determined by establishing the intensity of the x-ray radiation in at least two different energy ranges; calculating a ratio, between the intensity of the x-ray radiation established after the penetration and the intensity of the x-ray radiation established prior to the penetration, for the respectively same energy range; and determining the attenuation using the calculation in the determination of the attenuation.
地址 Munich DE