发明名称 TEST PATHS GENERATION FOR A PHYSICAL SYSTEM
摘要 <p>A system generates a test path set in a very efficient manner. The test path set may be tailored to test a target physical system, such as a complex set of source code, a manufacturing line of multiple process nodes, or other physical system. The system may generate the test path set to meet certain goals in testing the target physical system, for example comprehensive testing of system paths, system nodes, or particular subsets. As one example, the system may efficiently generate a test path set that uses the minimum number of test paths to test a coverage goal, for example traversing each of the prime paths in the target physical system. 0). CLn CLn CO. CD) CD) CD) CD CO) > Z C) CD >D c CD C) CD Iga Q3</p>
申请公布号 AU2015200305(A1) 申请公布日期 2015.08.06
申请号 AU20150200305 申请日期 2015.01.22
申请人 ACCENTURE GLOBAL SERVICES LIMITED 发明人 DWARAKANATH, ANURAG;JANKITI, ARUNA
分类号 G06F11/36;G06F11/28 主分类号 G06F11/36
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