发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device using an oxide semiconductor with stable electric characteristics to improve reliability.SOLUTION: A transistor that includes an oxide semiconductor film is provided with: a metal oxide film constituted by a constituent(s) similar to that of the oxide semiconductor film is laminated on the lower surface of the oxide semiconductor film; and an insulating film constituted by a different constituent(s) from that of the metal oxide film and oxide semiconductor film is formed in contact with a surface of the metal oxide film facing the oxide semiconductor film. Further, the oxide semiconductor film used for an active layer of the transistor is a highly purified and electrically modified to i-type (intrinsic) by performing heat treatment to remove impurities such as hydrogen, moisture, a hydroxyl group or a hydride, and supplying oxygen which is a main component material constituting the oxide semiconductor and reduced together with the impurities in the impurity removal step.
申请公布号 JP2015144311(A) 申请公布日期 2015.08.06
申请号 JP20150077463 申请日期 2015.04.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L21/336;H01L29/786;H01L51/50;H05B33/08;H05B33/14 主分类号 H01L21/336
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