发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a highly reliable display device by realizing high mobility in a device using an oxide semiconductor.SOLUTION: In a method of manufacturing a semiconductor device, an oxide semiconductor layer having a crystal region in which c-axis is oriented in a direction substantially perpendicular to a surface is formed, and an oxide insulating layer is formed on the oxide semiconductor layer in contact therewith. Oxygen is supplied to the oxide semiconductor layer by performing third heat treatment. A nitride insulating layer containing hydrogen is formed on the oxide insulating layer, and fourth heat treatment is performed, thereby hydrogen is supplied to at least an interface between the oxide semiconductor layer and the oxide insulating layer.
申请公布号 JP2015144296(A) 申请公布日期 2015.08.06
申请号 JP20150039778 申请日期 2015.03.02
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;G02F1/1368;H01L21/336;H01L21/8234;H01L21/8247;H01L27/088;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L29/786
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