发明名称 Complementary Field Effect Transistors Using Gallium Polar and Nitrogen Polar III-Nitride Material
摘要 A device with complementary non-inverted N-channel and inverted P-channel field effect transistors comprising a layer grown epitaxially on a substrate, a barrier layer, a two-dimensional electron gas in the first III-Nitride epitaxial layer, a second III-Nitride material layer, and a two-dimensional hole gas in the second III-Nitride epitaxial layer. A device with complementary inverted N-channel and non-inverted P-channel field effect transistors comprising a nitrogen-polar III-Nitride layer grown epitaxially, a barrier material layer, a two-dimensional hole gas, and a two-dimensional electron gas in the second III-Nitride epitaxial layer. A method of making complementary inverted P-channel and non-inverted N-channel III-Nitride field effect transistors. A method of making a complementary non-inverted P-channel field effect transistor and inverted N-channel III-Nitride field effect transistor on a substrate.
申请公布号 US2015221649(A1) 申请公布日期 2015.08.06
申请号 US201514666494 申请日期 2015.03.24
申请人 Kub Francis J.;Anderson Travis J.;Mastro Michael A.;Eddy, JR. Charles R.;Hite Jennifer K. 发明人 Kub Francis J.;Anderson Travis J.;Mastro Michael A.;Eddy, JR. Charles R.;Hite Jennifer K.
分类号 H01L27/092;H01L29/778;H01L21/8252 主分类号 H01L27/092
代理机构 代理人
主权项 1. A device with complementary non-inverted N-channel and inverted P-channel field effect transistors using gallium polar III-Nitride material comprising: a first gallium-polar III-Nitride material layer grown epitaxially on a substrate; a III-Nitride barrier material layer; a two-dimensional electron gas in the first gallium-polar III-Nitride material layer at the interface of the III-Nitride barrier material layer; a second III-Nitride material layer; a two-dimensional hole gas in the second III-Nitride material layer at the interface of the III-Nitride barrier material layer; a non-inverted N-channel III-Nitride field effect transistor in the first gallium-polar III-Nitride material layer; wherein the non-inverted N-channel III-Nitride field effect transistor has a two-dimensional electron gas; and an inverted P-Channel III-Nitride field effect transistor in the second III-Nitride material layer; wherein the inverted P-Channel III-Nitride field effect transistor has a two-dimensional hole gas.
地址 Arnold MD US