发明名称 |
Complementary Field Effect Transistors Using Gallium Polar and Nitrogen Polar III-Nitride Material |
摘要 |
A device with complementary non-inverted N-channel and inverted P-channel field effect transistors comprising a layer grown epitaxially on a substrate, a barrier layer, a two-dimensional electron gas in the first III-Nitride epitaxial layer, a second III-Nitride material layer, and a two-dimensional hole gas in the second III-Nitride epitaxial layer. A device with complementary inverted N-channel and non-inverted P-channel field effect transistors comprising a nitrogen-polar III-Nitride layer grown epitaxially, a barrier material layer, a two-dimensional hole gas, and a two-dimensional electron gas in the second III-Nitride epitaxial layer. A method of making complementary inverted P-channel and non-inverted N-channel III-Nitride field effect transistors. A method of making a complementary non-inverted P-channel field effect transistor and inverted N-channel III-Nitride field effect transistor on a substrate. |
申请公布号 |
US2015221649(A1) |
申请公布日期 |
2015.08.06 |
申请号 |
US201514666494 |
申请日期 |
2015.03.24 |
申请人 |
Kub Francis J.;Anderson Travis J.;Mastro Michael A.;Eddy, JR. Charles R.;Hite Jennifer K. |
发明人 |
Kub Francis J.;Anderson Travis J.;Mastro Michael A.;Eddy, JR. Charles R.;Hite Jennifer K. |
分类号 |
H01L27/092;H01L29/778;H01L21/8252 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
1. A device with complementary non-inverted N-channel and inverted P-channel field effect transistors using gallium polar III-Nitride material comprising:
a first gallium-polar III-Nitride material layer grown epitaxially on a substrate; a III-Nitride barrier material layer; a two-dimensional electron gas in the first gallium-polar III-Nitride material layer at the interface of the III-Nitride barrier material layer; a second III-Nitride material layer; a two-dimensional hole gas in the second III-Nitride material layer at the interface of the III-Nitride barrier material layer; a non-inverted N-channel III-Nitride field effect transistor in the first gallium-polar III-Nitride material layer; wherein the non-inverted N-channel III-Nitride field effect transistor has a two-dimensional electron gas; and an inverted P-Channel III-Nitride field effect transistor in the second III-Nitride material layer; wherein the inverted P-Channel III-Nitride field effect transistor has a two-dimensional hole gas. |
地址 |
Arnold MD US |