发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A transistor including an oxide semiconductor film, which has stable electric characteristics is provided. A transistor including an oxide semiconductor film, which has excellent on-state characteristics is also provided. A semiconductor device in which an oxide semiconductor film having low resistance is formed and the resistance of a channel region of the oxide semiconductor film is increased. Note that an oxide semiconductor film is subjected to a process for reducing the resistance to have low resistance. The process for reducing the resistance of the oxide semiconductor film may be a laser process or heat treatment at a temperature higher than or equal to 450° C. and lower than or equal to 740° C., for example. A process for increasing the resistance of the channel region of the oxide semiconductor film having low resistance may be performed by plasma oxidation or implantation of oxygen ions, for example.
申请公布号 US2015221754(A1) 申请公布日期 2015.08.06
申请号 US201514688199 申请日期 2015.04.16
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 HONDO Suguru;SHIMOMURA Akihisa;KOYAMA Masaki;KURATA Motomu;HANAOKA Kazuya;NAGAMATSU Sho;NEI Kosei;HASEGAWA Toru
分类号 H01L29/66;H01L21/46 主分类号 H01L29/66
代理机构 代理人
主权项 1. (canceled)
地址 Atugi-shi JP