发明名称 |
TEST APPARATUS OF SAMPLE AND CONTROL METHOD THEREOF |
摘要 |
The present invention relates to a sample inspecting device and a method for controlling the same. An aspect of the present invention provides a sample inspecting device comprising: a housing; a cartridge inserted into one side of the housing and accommodating a sample; a pressing member disposed in the housing, and pressing the cartridge to inspect the sample; a fluid storage part for transferring a fluid to the pressing member so that the pressing member presses the cartridge; and a fluid supplier for supplying a fluid to the fluid storage part. According to an embodiment of the present invention, a structure for moving the pressing member is improved, thereby miniaturizing a sample inspecting device. |
申请公布号 |
KR20150090582(A) |
申请公布日期 |
2015.08.06 |
申请号 |
KR20140011406 |
申请日期 |
2014.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JIN SOO;KIM SOO HONG |
分类号 |
G01N35/10;G01N1/10;G01N35/08 |
主分类号 |
G01N35/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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