发明名称 TEST APPARATUS OF SAMPLE AND CONTROL METHOD THEREOF
摘要 The present invention relates to a sample inspecting device and a method for controlling the same. An aspect of the present invention provides a sample inspecting device comprising: a housing; a cartridge inserted into one side of the housing and accommodating a sample; a pressing member disposed in the housing, and pressing the cartridge to inspect the sample; a fluid storage part for transferring a fluid to the pressing member so that the pressing member presses the cartridge; and a fluid supplier for supplying a fluid to the fluid storage part. According to an embodiment of the present invention, a structure for moving the pressing member is improved, thereby miniaturizing a sample inspecting device.
申请公布号 KR20150090582(A) 申请公布日期 2015.08.06
申请号 KR20140011406 申请日期 2014.01.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JIN SOO;KIM SOO HONG
分类号 G01N35/10;G01N1/10;G01N35/08 主分类号 G01N35/10
代理机构 代理人
主权项
地址