发明名称 |
Surface delayering with a programmed manipulator |
摘要 |
A method and apparatus for use in surface delayering for fault isolation and defect localization of a sample work piece is provided. More particularly, a method and apparatus for mechanically peeling of one or more layers from the sample in a rapid, controlled, and accurate manner is provided. A programmable actuator includes a delayering probe tip with a cutting edge that is shaped to quickly and accurately peel away a layer of material from a sample. The cutting face of the delayering probe tip is configured so that each peeling step peels away an area of material having a linear dimension substantially equal to the linear dimension of the delayering probe tip cutting face. The surface delayering may take place inside a vacuum chamber so that the target area of the sample can be observed in-situ with FIB/SEM imaging. |
申请公布号 |
EP2902845(A1) |
申请公布日期 |
2015.08.05 |
申请号 |
EP20150152977 |
申请日期 |
2015.01.29 |
申请人 |
FEI COMPANY |
发明人 |
BUXBAUM, ALEXANDER;SCHMIDT, MICHAEL |
分类号 |
G03F1/72;B26D3/28;B28D5/04;G01N1/06;G03F1/00;G03F7/20;H01L21/304 |
主分类号 |
G03F1/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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