发明名称 置換金属ゲートを有するトランジスタ及びその製造方法
摘要 <p>A transistor is fabricated by removing a polysilicon gate over a doped region of a substrate and forming a mask layer over the substrate such that the doped region is exposed through a hole within the mask layer. An interfacial layer is deposited on top and side surfaces of the mask layer and on a top surface of the doped region. A layer adapted to reduce a threshold voltage of the transistor and/or reduce a thickness of an inversion layer of the transistor is deposited on the interfacial layer. The layer includes metal, such as aluminum or lanthanum, which diffuses into the interfacial layer, and also includes oxide, such as hafnium oxide. A conductive plug, such as a metal plug, is formed within the hole of the mask layer. The interfacial layer, the layer on the interfacial layer, and the conductive plug are a replacement gate of the transistor.</p>
申请公布号 JP5759550(B2) 申请公布日期 2015.08.05
申请号 JP20130527530 申请日期 2011.08.18
申请人 发明人
分类号 H01L21/336;H01L21/28;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/336
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