发明名称 Expitaxial film on nanoscale structure
摘要 <p>An embodiment of the invention includes an epitaxial layer that directly contacts, for example, a nanowire, fin, or pillar in a manner that allows the layer to relax with two or three degrees of freedom. The epitaxial layer may be included in a channel region of a transistor. The nanowire, fin, or pillar may be removed to provide greater access to the epitaxial layer. Doing so may allow for a "all-around gate" structure where the gate surrounds the top, bottom, and sidewalls of the epitaxial layer. Other embodiments are described herein.</p>
申请公布号 GB2522826(A) 申请公布日期 2015.08.05
申请号 GB20150010001 申请日期 2013.06.29
申请人 INTEL CORPORATION 发明人 BENJAMIN CHU-KUNG;VAN H LE;ROBERT S CHAU;SANSAPTAK DASGUPTA;GILBERT DEWEY;NITIKA GOEL;JACK T KAVALIEROS;MATTHEW V METZ;NILOY MUKHERJEE;RAVI PILLARISETTY;WILLY RACHMADY;MARKO RADOSAVLJEVIC;HAN WUI THEN;NANCY M ZELICK
分类号 H01L29/267;H01L29/06;H01L29/165;H01L29/775 主分类号 H01L29/267
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