摘要 |
<p>The invention pertains to a process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, comprising taking measurements of the first locally measurable loop characteristic for a plurality of loops; obtaining a reference data set representing reference estimates of the loop feature value, the reference estimates being obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters; and determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters. The invention also comprises a system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters.</p> |