发明名称 第1の局所的に測定可能なループ特性と第1の組のパラメータとを用いて第1のループ特徴値推定方法を較正するための方法およびシステム
摘要 <p>The invention pertains to a process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, comprising taking measurements of the first locally measurable loop characteristic for a plurality of loops; obtaining a reference data set representing reference estimates of the loop feature value, the reference estimates being obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters; and determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters. The invention also comprises a system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters.</p>
申请公布号 JP5759016(B2) 申请公布日期 2015.08.05
申请号 JP20130546669 申请日期 2011.12.21
申请人 发明人
分类号 H04B3/46;G01R35/00 主分类号 H04B3/46
代理机构 代理人
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