发明名称 INSULATED GATE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>An insulated gate semiconductor device includes a region that is provided between trenches (10) in which a gate electrode (6) is filled through a gate insulating film (5a) in a surface layer of a substrate, includes a p base region (3) and an n + emitter region (4), and comes into conductive contact with an emitter electrode (8) and a p-type floating region (20) that is electrically insulated by an insulating film (7) which is interposed between the p-type floating region (20) and the emitter electrode (8). The p-type floating region (20) is deeper than the trench (10) and has a lower impurity concentration than the p base region (3).</p>
申请公布号 EP2787534(A4) 申请公布日期 2015.08.05
申请号 EP20120853082 申请日期 2012.11.15
申请人 FUJI ELECTRIC CO., LTD. 发明人 ONOZAWA, YUICHI
分类号 H01L29/78;H01L29/06;H01L29/10;H01L29/40;H01L29/66;H01L29/739 主分类号 H01L29/78
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