| 摘要 |
The invention relates to a high-resolution retinal imaging method and device notably comprising an emission source (LSr) for emitting a light beam for the illumination of the retina of an eye (10) of a subject, a detection device (12) capable of detecting spatial-frequency structures of 250 cycles/mm measured in the plane of the retina, an optical imaging system (16) allowing for the formation of an image of at least a part of the retina on the detection device (12), a device (15) for measuring optical defects with an analysis plane of the optical defects, a correction device (14) comprising a correction plane and intended to correct, in said correction plane, the light rays from said emission source (LSr) and backscattered by the retina as a function of the optical defects measured by the measurement device (15). The correction and analysis planes are optically conjugated with a predetermined plane (17) of the eye, and the input pupil of said optical imaging system has a diameter of between a first value Phimin and a second value Phimax, the first value being defined to allow for the detection by said detection device (12), at an imaging wavelength, of structures of the retina exhibiting a spatial frequency of 250 cycles per millimeter, and the second value being less than 5.75 mm. |
