| 摘要 |
The present invention provides a defect analysis device including: an excitation unit (107) that imparts vibrations of a plurality of frequencies to a fluid (110) flowing through a pipe (108); a first detector (106) that, when the excitation part (107) is imparting vibrations, detects vibrations emanating from the pipe (108); and a signal processing unit (101) that extracts a feature quantity from a vibration waveform acquired by the first detector (106), and uses the extracted feature quantity to estimate the extent of a defect formed in the pipe (108). |
