发明名称 Lithographic apparatus and device manufacturing method
摘要 A gas knife configured to dry a surface in an immersion lithographic apparatus is optimized to remove liquid by ensuring that a pressure gradient is built up in the liquid film on the surface being dried.
申请公布号 US9099501(B2) 申请公布日期 2015.08.04
申请号 US201012901939 申请日期 2010.10.11
申请人 ASML NETHERLANDS B.V. 发明人 Kemper Nicolaas Rudolf;Donders Sjoerd Nicolaas Lambertus;Hoogendam Christiaan Alexander;Ten Kate Nicolaas;Shulepov Sergei
分类号 G03B27/52;H01L21/67;G03F7/20 主分类号 G03B27/52
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic projection apparatus, comprising: a projection system arranged to project a pattern from a patterning device onto a substrate through a liquid; a gas knife configured to provide gas to a surface to be dried; and an extractor positioned adjacent the gas knife to remove gas, liquid, or both, wherein an outlet of the gas knife and an inlet of the extractor are formed in a substantially flat surface, the distance between the inlet of the extractor and the outlet being 0.5 to 0.8 times the distance the flat surface extends on the other side to the extractor of the gas knife to the nearer of another extractor or the end of the flat surface on the other side.
地址 Veldhoven NL