| 摘要 |
Described herein are systems, devices, and methods facilitating optical characterization of scattering samples. A polarized optical beam can be directed to pass through a sample to be tested. The optical beam exiting the sample can then be analyzed to determine its degree of polarization, from which other properties of the sample can be determined. In some cases, an apparatus can include a source of an optical beam, an input polarizer, a sample, an output polarizer, and a photodetector. In some cases, a signal from a photodetector can be processed through attenuation, variable offset, and variable gain. |
| 主权项 |
1. An optical system for inspecting a sample, comprising:
an input polarizer situated to receive an optical beam, produce a polarized input optical beam, and direct the polarized input beam to the sample; an output polarizer situated to receive the polarized input optical beam from the sample and form an output optical beam; a photodetector situated to receive the output optical beam; and a photodetector processor coupled to the photodetector and configured to provide an output value based on a comparison of a photosignal from the photodetector and a predetermined reference value, wherein the photosignal from the photodetector is a photocurrent, the photodetector processor is configured to combine an offset current with the photocurrent to form an output current, the reference value is associated with the output current, and wherein the output value is associated with a degree of polarization of the output optical beam. |
