发明名称 METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS
摘要 <p>Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.</p>
申请公布号 CA2690633(C) 申请公布日期 2015.08.04
申请号 CA20082690633 申请日期 2008.06.13
申请人 HISTORX, INC. 发明人 CHRISTIANSEN, JASON;PINARD, ROBERT;ZERKOWSKI, MACIEJ P.;TEDESCHI, GREGORY R.
分类号 G01N21/64 主分类号 G01N21/64
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