Modular atomic force microscope with environmental controls

摘要

A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

主权项

1. An apparatus for isolating a probe and sample of an atomic force microscope system that operates to characterize sample properties in a particular environment or at a particular temperature, comprising:
an atomic force microscope, having an atomic force microscope cantilever; an isolation apparatus, coupled to said atomic force microscope, that includes a holder for the cantilever which includes a window above the cantilever which closes a top of said atomic force microscope, a stage where the sample is mounted, located below the cantilever and which closes a bottom of said atomic force microscope, and includes a dovetail pointed away from a bottom of the stage and a cell body joined to said cantilever holder and said sample stage which completes closure of said system; and a mechanism for scanning the stage in all of X, Y and Z dimensions, coupled to said atomic force microscope, that includes at the top of said mechanism a receiving dovetail connecting to the dovetail of said sample stage to be securely fastened to the mechanism.