发明名称 |
X-ray dose estimation technique |
摘要 |
Embodiments of the disclosure relate to projection-based dose estimation for X-ray systems, such as X-ray imaging systems. For example, in one embodiment, an X-ray system is capable of estimating an X-ray dose based on an intensity profile of the detected X-rays that have passed through a scanned object and an estimated mass of the object. In one embodiment, the intensity profile may be compared to a baseline scan to acquire an estimate of energy interaction with the object. |
申请公布号 |
US9097642(B2) |
申请公布日期 |
2015.08.04 |
申请号 |
US201213649942 |
申请日期 |
2012.10.11 |
申请人 |
General Electric Company |
发明人 |
Yin Zhye;De Man Bruno Kristiaan Bernard;Tian Xiaoyu |
分类号 |
G01N23/04;A61B6/00 |
主分类号 |
G01N23/04 |
代理机构 |
|
代理人 |
Dobson Melissa K. |
主权项 |
1. An X-ray system comprising:
an X-ray source configured to generate an X-ray beam; a detector configured to detect X-rays of the X-ray beam that pass through an object, and to detect X-rays of the X-ray beam when the object is not in a field of view; and a processor coupled to the detector and configured to receive information generated by the detector related to the detected X-rays, and wherein the processor is configured to execute instructions for:
determining an object intensity profile from the object scan of the detected X-rays that pass through the object and determining a baseline intensity profile using a baseline scan of the detected X-rays when the object is not in view;determining a combined attenuation profile of the detected X-rays that pass through the object, wherein the combined attenuation profile is generated by combining the object scan and the baseline scan;estimating an energy interaction with the object based on the baseline intensity profile and the object intensity profile;estimating a mass of the object based on the combined attenuation profile; anddetermining an estimated dose value based at least in part on the energy interaction with the object and the mass of the object. |
地址 |
Niskayuna NY US |