发明名称 PLASMA PROCESSING DEVICE, AND PLASMA PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing device or a plasma processing method, in which yield is improved by inhibiting a sample to be processed from being contaminated.SOLUTION: There is disclosed a plasma processing device or a plasma processing method, in which a sample arranged inside a vacuum container and arranged inside a processing chamber is processed by using plasma formed inside the processing chamber. A temperature of a location constituting an inside surface of a film which is arranged inside the processing chamber and covers a surface of a base material of a first member composing an inside surface facing the plasma, the film being formed by flame spray of a material consisting of a dielectric on the surface of the base material, is adjusted so as to become equal to or less than 55°C according to the processing condition of the film.
申请公布号 JP2015141956(A) 申请公布日期 2015.08.03
申请号 JP20140012916 申请日期 2014.01.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 IKENAGA KAZUYUKI;NAKATANI SHINTARO;KOBAYASHI HIROYUKI
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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