| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for inspecting a nonvolatile memory, capable of inspecting the nonvolatile memory even by an inexpensive arithmetic unit. ! SOLUTION: A method for inspecting a nonvolatile memory comprises: comparing a first error detection value calculated when writing data in a nonvolatile memory 3 with a second error detection value calculated from the data written in the nonvolatile memory 3; and inspecting data of a use area having the data written in the nonvolatile memory 3 to compare whether or not a free area without the written data of the nonvolatile memory 3 has a deletion value of the nonvolatile memory 3. ! COPYRIGHT: (C)2015,JPO&INPIT |
