| 摘要 |
Disclosed is an integrated circuit test interface which can upgrade automatic test equipment testing a semiconductor device. The integrated circuit test interface comprises at least one fin for receiving at least one test signal from a tester of automatic test equipment; multiple digitizers connected to at least one fin, and generating a digital signal; a process means connected to the multiple digitizers, and processing a digital signal; and a connection unit connecting a calculation device to the process means, and transmitting an output signal to the calculation device, wherein the integrated circuit test interface is arranged between the tester of the automatic test equipment and a prober. |
