半导体元件对准插座单元以及含其之半导体元件测试装置;SEMICONDUCTOR DEVICE ALIGNMENT SOCKET UNIT AND SEMICONDUCTOR DEVICE TEST APPARATUS INCLUDING THE SAME

摘要

本发明提供一种半导体元件对准插座单元。所述半导体元件对准插座单元包含：具有开口的插入体，所封装的半导体元件被收纳于所述开口中以便进行测试；导引薄片，其提供于所述插入体的底表面上，且允许提供于所述半导体元件上的球形端子与插入位置对准；基座单元，其上安装有所述插入体的所述底表面，且包含经安置成面向所述球形端子的多个探针接脚；以及导引衬垫，其紧密地附接至所述导引薄片的底表面，具有所述多个探针接脚的上端插入至的导孔且始终将所述多个探针接脚导引至正常位置。; a guide sheet that is provided on a bottom surface of the insertion body and allows ball terminals provided on the semiconductor device to be aligned with insertion positions; a base unit on which the bottom surface of the insertion body is mounted and that includes a plurality of probe pins disposed to face the ball terminal; and a guide pad that is closely attached to a bottom surface of the guide sheet, has guide holes into which upper ends of the plurality of probe pins are inserted and guides the plurality of probe pins always to normal positions.