自动测试设备的积体电路测试介面;INTEGRATED CIRCUIT TESTING INTERFACE ON AUTOMATIC TEST EQUIPMENT

摘要

一种可升级一自动测试设备的积体电路测试介面，以测试一待测元件，该积体电路测试介面包含有至少一引脚，用来接收或传送至少一测试讯号至该自动测试设备之一测试机；复数个数化器，耦接于该至少一引脚，以产生一数位讯号；一处理器，耦接于该复数个数化器，用来进行该数位讯号的处理；以及一连接件，用来连接该处理器与一电脑设备，以将该处理器之一输出讯号传送至该电脑设备；其中，该积体电路测试介面设置于该自动测试设备之该测试机与一针测机之间。; a plurality of digitizers, coupled to the at least one pin for generating a digital signal; a processing means, coupled to the plurality of digitizers for processing the digital signal; and a connection unit, for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device; wherein the IC testing interface is disposed between the tester and a prober of the automatic test equipment.