发明名称 STRUCTURE AND METHOD FOR SINGLE GATE NON-VOLATILE MEMORY DEVICE
摘要 <p>The present disclosure provides an integrated circuit. The integrated circuit includes a semiconductor substrate having a periphery region and a memory region; a field effect transistor disposed in the periphery region and having silicide features; and a single floating gate non-volatile memory device disposed in the memory region, free of silicide and having a first gate electrode and a second gate electrode laterally spaced from each other.</p>
申请公布号 KR20150088230(A) 申请公布日期 2015.07.31
申请号 KR20150100396 申请日期 2015.07.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 TSUI YING KIT;TSENG HUANG WEN
分类号 H01L27/115;H01L21/28;H01L21/8238;H01L29/788 主分类号 H01L27/115
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