TEST APPARATUS OF CIRCUIT BOARD HAVING PROBE PIN FIXING BLOCK AND METHOD OF REPLACING THE PROBE PIN OF THE SAME

摘要

A probe pin fixing block may include: a case member which includes a first aperture arranged at a first direction and a second aperture arranged at a second direction opposite to the first direction; a first probe pin which is installed in the case member, and is exposed toward the second direction through the second aperture; and at least second probe pin which is installed to be stacked along the first direction on the first probe pin in the case member.