发明名称 SCANNING PROBE MICROSCOPE WITH IMPROVED RESOLUTION - MULTI SCANNER SPM
摘要 <p>Scanning Probe Microscope (SPM) including two or more three-dimensional scanners. One of the scanners, called general view scanner, has large maximum scanning area while the others, called detailed view scanners, have smaller ones.</p>
申请公布号 WO2015110870(A1) 申请公布日期 2015.07.30
申请号 WO2014IB58567 申请日期 2014.01.27
申请人 KAZAKEVICH, MICHAEL 发明人 KAZAKEVICH, MICHAEL
分类号 G01Q70/02;G01B21/30;G01Q10/00 主分类号 G01Q70/02
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