发明名称 Textured pattern sensing using partial-coherence speckle interferometry
摘要 <p>A system for imaging a textured surface includes a light source that is configured to project an electromagnetic radiation beam onto the textured surface, wherein the projected beam generates first radiation reflected from a first portion of the textured surface to form a speckle pattern, and second radiation reflected from a second portion of the textured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector, and may be processed to generate an image of the textured surface from the first and second reflected radiation. Methods for textured surface sensing are also disclosed.</p>
申请公布号 IL210957(A) 申请公布日期 2015.07.30
申请号 IL20110210957 申请日期 2011.01.30
申请人 RAYTHEON COMPANY 发明人
分类号 G01B;G06K 主分类号 G01B
代理机构 代理人
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