发明名称 Small-Grain Three-Dimensional Memory
摘要 The present invention discloses a small-grain three-dimensional memory (3D-MSG). Each of its memory cells comprises a thin-film diode with critical dimension no larger than 40 nm. The thin-film diode comprises at least a small-grain material, whose grain size G is substantially smaller than the diode size D. The small-grain material is preferably a nano-crystalline material or an amorphous material. The critical dimension f of the small-grain diode is smaller than the critical dimension F of the single-crystalline transistor.
申请公布号 US2015214277(A1) 申请公布日期 2015.07.30
申请号 US201514614434 申请日期 2015.02.05
申请人 HangZhou HaiCun Information Technology Co., Ltd. 发明人 ZHANG Guobiao;YU Bin;YU HongYu;HE Jin;KANG JinFeng;LIU ZhiWei
分类号 H01L27/24;H01L27/112 主分类号 H01L27/24
代理机构 代理人
主权项 1. A small-grain three-dimensional memory, comprising: a substrate level comprising a semiconductor substrate, said substrate level further comprising a plurality of functional transistors, said functional transistors forming at least a processing circuit; and at least a first memory level stacked above said semiconductor substrate and coupled to said substrate level through a plurality of inter-level vias, said memory level comprising a plurality of memory cells, wherein each of said memory cells comprises a small-grain diode with a critical dimension no larger than 40 nm, a grain size of said small-grain diode being substantially smaller than a small-grain diode size; wherein the critical dimension of said first memory level is smaller than the critical dimension of said substrate level.
地址 HangZhou CN