| 发明名称 |
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS |
| 摘要 |
A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen. |
| 申请公布号 |
US2015211995(A1) |
申请公布日期 |
2015.07.30 |
| 申请号 |
US201514677170 |
申请日期 |
2015.04.02 |
| 申请人 |
SYSMEX CORPORATION |
发明人 |
YAMAMOTO Norimasa;YAMATO Takashi;MATSUO Naohiko;IGUCHI Satoshi |
| 分类号 |
G01N21/59;G01N21/31;G01N21/03 |
主分类号 |
G01N21/59 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A specimen analyzing method comprising steps of:
sucking a specimen stored in a specimen container and sampling the specimen into a first container; optically measuring said specimen in said first container; sampling said specimen into a second container and preparing a measurement sample by mixing the specimen with a reagent in the second container; and analyzing said measurement sample according to a result of the optical measurement of said specimen. |
| 地址 |
Kobe-shi JP |
