发明名称 |
SEMICONDUCTOR-WAFER CLEANING TANK AND METHOD FOR MANUFACTURING BONDED WAFER |
摘要 |
This invention is a semiconductor-wafer cleaning tank in which semiconductor wafers are immersed in a cleaning solution and cleaned. Said semiconductor-wafer cleaning tank is characterized by comprising the following: a quartz main tank body that holds the aforementioned cleaning solution, in which a plurality of semiconductor wafers are immersed; a quartz overflow-catching part that is provided around an opening in the main tank body and catches cleaning solution that has overflowed from the top edge of said opening; and a thermally insulating wall provided around the main tank body. This semiconductor-wafer cleaning tank is also characterized in that the thermally insulating wall forms an unbroken enclosure around the main tank body with a hollow layer formed between the thermally insulating wall and the side wall of the main tank body. A cleaning tank used in an etching step for film-thickness adjustment whereby bonded wafers that exhibit uniform film thickness even after said etching step can be manufactured with high yield is thus provided. |
申请公布号 |
WO2015111383(A1) |
申请公布日期 |
2015.07.30 |
申请号 |
WO2015JP00102 |
申请日期 |
2015.01.13 |
申请人 |
SHIN-ETSU HANDOTAI CO.,LTD. |
发明人 |
NAGAOKA, YASUO |
分类号 |
H01L21/306;H01L21/02;H01L21/304 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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