发明名称 SEMICONDUCTOR-WAFER CLEANING TANK AND METHOD FOR MANUFACTURING BONDED WAFER
摘要 This invention is a semiconductor-wafer cleaning tank in which semiconductor wafers are immersed in a cleaning solution and cleaned. Said semiconductor-wafer cleaning tank is characterized by comprising the following: a quartz main tank body that holds the aforementioned cleaning solution, in which a plurality of semiconductor wafers are immersed; a quartz overflow-catching part that is provided around an opening in the main tank body and catches cleaning solution that has overflowed from the top edge of said opening; and a thermally insulating wall provided around the main tank body. This semiconductor-wafer cleaning tank is also characterized in that the thermally insulating wall forms an unbroken enclosure around the main tank body with a hollow layer formed between the thermally insulating wall and the side wall of the main tank body. A cleaning tank used in an etching step for film-thickness adjustment whereby bonded wafers that exhibit uniform film thickness even after said etching step can be manufactured with high yield is thus provided.
申请公布号 WO2015111383(A1) 申请公布日期 2015.07.30
申请号 WO2015JP00102 申请日期 2015.01.13
申请人 SHIN-ETSU HANDOTAI CO.,LTD. 发明人 NAGAOKA, YASUO
分类号 H01L21/306;H01L21/02;H01L21/304 主分类号 H01L21/306
代理机构 代理人
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