发明名称 |
PROBER, AND APPARATUS FOR POLISHING NEEDLE TIP OF PROBE CARD |
摘要 |
PROBLEM TO BE SOLVED: To provide a prober which makes it possible to press a polished face of a needle tip against each probe needle of a probe card without fault.SOLUTION: A prober 10 comprises: a probe card 16 having probe needles 17; and a needle tip polishing unit 24. The needle tip polishing unit 24 has: a WAPP 28 which is brought into contact with a needle tip; and a support member 27 for supporting the WAPP 28. The WAPP 28 has a wrapping sheet 29 provided on its upper surface, and concave parts 31 formed in a bottom face 30. The support member 27 has convex parts 33 formed on its ceiling face 32. With the WAPP 28 placed in a standby position, the convex parts 33 are engaged with the concave parts 31. When the WAPP 28 is moved to a contact position, the top of each convex part 33 abuts against a part of the bottom face 30 where the concave parts 31 are not formed. |
申请公布号 |
JP2015138888(A) |
申请公布日期 |
2015.07.30 |
申请号 |
JP20140009725 |
申请日期 |
2014.01.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
YANO KAZUYA;AKIYAMA SHUJI |
分类号 |
H01L21/66;G01R1/073;G01R31/26 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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