发明名称 INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREOF
摘要 An integrated circuit includes a semiconductor substrate, and at least two transistors connected in series on the semiconductor substrate, wherein each transistor shares a source electrode or a drain electrode with an adjacent transistor. The integrated circuit also includes a hermetic cavity disposed on the source electrode and the drain electrode, between gate electrodes of adjacent transistors. The source electrode disposed at a first end portion of the series of transistors is in direct contact with a source interconnect, and the drain electrode disposed at a second end portion of the series of transistors is in direct contact with a drain interconnect.
申请公布号 US2015214296(A1) 申请公布日期 2015.07.30
申请号 US201514597126 申请日期 2015.01.14
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 HUANG Herb He;DROWLEY Clifford Ian
分类号 H01L29/06;H01L21/84;H01L29/66;H01L27/12 主分类号 H01L29/06
代理机构 代理人
主权项 1. An integrated circuit comprising: a semiconductor substrate; at least two transistors connected in series on the semiconductor substrate, wherein each transistor shares a source electrode or a drain electrode with an adjacent transistor; a hermetic cavity disposed on the source electrode and the drain electrode, between gate electrodes of adjacent transistors; wherein the source electrode disposed at a first end portion of the series of transistors is in direct contact with a source interconnect, and the drain electrode disposed at a second end portion of the series of transistors is in direct contact with a drain interconnect.
地址 Shanghai CN