发明名称 DETECTING HOTSPOTS USING MACHINE LEARNING ON DIFFRACTION PATTERNS
摘要 A mechanism is provided in a data processing system for detecting lithographic hotspots. The mechanism receives a design layout. The mechanism generates spatial pattern clips from the design layout. The mechanism performs a transform on the spatial pattern clips to form frequency domain pattern clips. The mechanism performs feature extraction on the frequency domain pattern clips to form frequency domain features. The mechanism utilizes the extracted features on a set of training samples to train a machine learning classifier model. The mechanism classifies a set of previously unseen patterns, based on frequency domain features of the previously unseen patterns using the trained machine learning classifier model, into hotspots and non-hotspots.
申请公布号 US2015213374(A1) 申请公布日期 2015.07.30
申请号 US201414162889 申请日期 2014.01.24
申请人 International Business Machines Corporation 发明人 Agarwal Kanak B.;Banerjee Shayak;Pathak Piyush
分类号 G06N99/00;G06F17/50;G06N5/04 主分类号 G06N99/00
代理机构 代理人
主权项 1. A method, in a data processing system, for detecting lithographic hotspots, the method comprising: receiving a design layout; generating spatial pattern clips from the design layout; performing a transform on the spatial pattern clips to form frequency domain pattern clips; performing feature extraction on the frequency domain pattern clips to form frequency domain features; utilizing the extracted features on a set of training samples to train a machine learning classifier model; and classifying a set of previously unseen patterns, based on frequency domain features of the previously unseen patterns using the trained machine learning classifier model, into hotspots and non-hotspots.
地址 Armonk NY US