| 发明名称 |
MEASUREMENT EQUIPMENT |
| 摘要 |
The measurement equipment includes a rack, a first image capturing device, a second image capturing device, a third image capturing device and a fourth image capturing device. Wherein, the first image capturing device and the second image capturing device capture an entire image of a to-be-measured object, the third image capturing device and the fourth image capturing device capture a plurality of local images of a plurality of local areas of the to-be-measured object, and the entire image and the local images and are simultaneously captured. |
| 申请公布号 |
US2015211852(A1) |
申请公布日期 |
2015.07.30 |
| 申请号 |
US201414167786 |
申请日期 |
2014.01.29 |
| 申请人 |
ADVANCED SEMICONDUCTOR ENGINEERING, INC. |
发明人 |
PARK Seungbae;HSU Yu-Ho;KAO Chin-Li;HUANG Tai-Yuan |
| 分类号 |
G01C11/04;G01B11/00;G06T7/00 |
主分类号 |
G01C11/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measurement equipment comprising:
a rack; a first image capturing device fixedly disposed on the rack; a second image capturing device fixedly disposed on the rack; a third image capturing device movably disposed on the rack; a fourth image capturing device movably disposed on the rack; wherein, the first image capturing device and the second image capturing device capture an entire image of a to-be-measured object, the third image capturing device and the fourth image capturing device capture a plurality of local images of a plurality of local areas of the to-be-measured object, and the entire image and the local images and are simultaneously captured. |
| 地址 |
Kaohsiung TW |
