EDDY CURRENT PROBE ROTATOR

摘要

Provided is an inspection apparatus that includes a rotation disk configured to spin about an axis of rotation. The rotation disk includes a probe bushing configured to securely hold a standard eddy current probe a predetermined distance above a surface to be examined by the probe. The rotation disk is further configured to adjustably hold the standard eddy current probe such that the radial offset of the probe from the axis of rotation is set using a radial positioning set screw that is coupled to the rotation disk via a first slotted arm. The predetermined distance is set using a probe height set screw configured to secure the probe within the probe bushing. An outer stationary housing is coupled to the rotation disk such that the rotation disk rotates within the outer stationary housing.

主权项

1. An inspection apparatus comprising:
a rotation disk configured to spin about an axis of rotation,
wherein the rotation disk comprises a probe bushing configured to securely hold an eddy current probe a predetermined distance above a surface to be examined by the probe,wherein the rotation disk is configured to adjustably hold the eddy current probe such that a radial offset of the probe from the axis of rotation is set using a radial positioning set screw coupled to the rotation disk using a first slotted arm and the predetermined distance is set using a probe height set screw configured to secure the probe within the probe bushing; an outer stationary housing coupled to the rotation disk such that the rotation disk rotates within the outer stationary housing; a driving mechanism configured to spin the rotation disk within the outer stationary housing such that the probe revolves about the axis of rotation; and a second slotted arm comprising a first end pivotally mounted to the outer stationary housing and a second end slidably mounted to the probe bushing thereby preventing the eddy current probe from rotating about a longitudinal axis of the eddy current probe when the probe rotates above the surface to be examined.