| 摘要 |
PROBLEM TO BE SOLVED: To appropriately perform measurement even when actual signal source impedance of a DUT is different from a nominal value of a specification.SOLUTION: A probe 302 is connected to a DUT (device under test) 304 and is also connected to a test measurement device 300. A memory 306 stores an S parameter of the probe. In the test measurement device 300, there are a memory 308 in which an S parameter of the test measurement device 300 is stored, a processor 310, and a display device 312. A user is allowed to identify nominal signal source impedance of the DUT 304 for equalization filter calculation through the display device 312. The processor 310 receives the S parameter of the probe and the DUT nominal signal source impedance to calculate an equalization filter. |
