Apparatuses and Methods for Measuring Flicker Noise

摘要

Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, an amplification circuit configured to amplify an output signal of the DUT, a second circuit path configured to drive a second terminal of the DUT, a third circuit path configured to couple a third terminal of the DUT to a circuit ground, and a decoupling circuit configured to decouple the DUT and the amplification circuit, logic configured to detect output signal characteristics of the DUT, logic configured to adjust input impedance of the amplification circuit based on the output signal characteristics of the DUT, and logic configured to measure a flicker noise of the DUT using the amplification circuit with adjusted input impedance.

主权项

1. A noise measurement system, comprising:
a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system; an amplification circuit configured to amplify an output signal of the DUT; a second circuit path configured to drive a second terminal of the DUT, a third circuit path configured to couple a third terminal of the DUT to a circuit ground, and a decoupling circuit configured to decouple the DUT and the amplification circuit; logic configured to detect output signal characteristics of the DUT; logic configured to adjust input impedance of the amplification circuit based on the output signal characteristics of the DUT; and logic configured to measure a flicker noise of the DUT using the amplification circuit with adjusted input impedance.