发明名称 DIAGNOSTIC CIRCUIT FOR TESTING A CIRCUIT
摘要 A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second terminal for connecting to the sinusoidal source, and a relay connected between the first and second terminals for connecting the sinusoidal source to the load. Clamping diodes are provide for clamping a sinusoidal signal and include a first clamping diode connected between a D/C voltage source and the input and a second clamping diode connected between ground and the input. A resistor is connected between the D/C voltage source and the first terminal. The diagnostic circuit verifies the operational functionality of the load, related wiring and connections.
申请公布号 US2015212148(A1) 申请公布日期 2015.07.30
申请号 US201414163532 申请日期 2014.01.24
申请人 DIEHL AKO STIFTUNG & CO. KG 发明人 AICHER JOCHEN;ALVORD ROBERT J.;KOPEC JAMES W.;NGUYEN VU T.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. A diagnostic circuit for connecting to a unit under test having at least two loads, the diagnostic circuit comprising: terminals including a first terminal for connecting to a first load and a second terminal for connecting to a second load a voltage sensing device having an input for sensing a signal and coupled to said terminals; a D/C source and ground; a first resistor having a first end connected to said D/C source and a second end connected to said first terminal; and a second resistor having a first end connected to said D/C source and a second end connected to said second terminal.
地址 WANGEN DE