发明名称 |
DIAGNOSTIC CIRCUIT FOR TESTING A CIRCUIT |
摘要 |
A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second terminal for connecting to the sinusoidal source, and a relay connected between the first and second terminals for connecting the sinusoidal source to the load. Clamping diodes are provide for clamping a sinusoidal signal and include a first clamping diode connected between a D/C voltage source and the input and a second clamping diode connected between ground and the input. A resistor is connected between the D/C voltage source and the first terminal. The diagnostic circuit verifies the operational functionality of the load, related wiring and connections. |
申请公布号 |
US2015212148(A1) |
申请公布日期 |
2015.07.30 |
申请号 |
US201414163532 |
申请日期 |
2014.01.24 |
申请人 |
DIEHL AKO STIFTUNG & CO. KG |
发明人 |
AICHER JOCHEN;ALVORD ROBERT J.;KOPEC JAMES W.;NGUYEN VU T. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
1. A diagnostic circuit for connecting to a unit under test having at least two loads, the diagnostic circuit comprising:
terminals including a first terminal for connecting to a first load and a second terminal for connecting to a second load a voltage sensing device having an input for sensing a signal and coupled to said terminals; a D/C source and ground; a first resistor having a first end connected to said D/C source and a second end connected to said first terminal; and a second resistor having a first end connected to said D/C source and a second end connected to said second terminal. |
地址 |
WANGEN DE |