发明名称 MAGNETIC MEMORY CELLS AND METHODS OF FORMATION
摘要 Memory cells including cell cores having free regions are disclosed. The free regions exhibit a strain that affects a magnetization orientation within the cell core. A stressor structure may exert a stress upon at least a portion of the cell core to effect the strain state of the free region. Also disclosed are semiconductor device structures and systems including such memory cells as well as methods for forming such memory cells.
申请公布号 US2015214472(A1) 申请公布日期 2015.07.30
申请号 US201514685236 申请日期 2015.04.13
申请人 Micron Technology, Inc. 发明人 Sandhu Gurtej S.;Kinney Wayne I.
分类号 H01L43/08;H01L43/12;H01L43/02 主分类号 H01L43/08
代理机构 代理人
主权项 1. A magnetic memory cell, comprising: a cell core comprising: a free region exhibiting a vertical magnetic orientation;a pinned region exhibiting a vertical magnetic orientation; anda nonmagnetic region between the free region and the pinned region; a stressor structure laterally about at least a portion of the cell core, the stressor structure applying a stress to at least the portion of the cell core to effect a strain exhibited by the free region, the strain effecting the vertical magnetic orientation exhibited by the free region, the stressor structure defining a substantially uniform lateral dimension along a height of the stressor structure; a conductive material above the cell core and the stressor structure; and another conductive material beneath the cell core and the stressor structure.
地址 Boise ID US