发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
The purpose of the present invention is to improve a performance of a semiconductor device, The present invention provides a method for manufacturing a semiconductor device comprising: forming a groove part (TP); forming an insulating film (F1) containing a silicon oxide film by a CVD method using gas containing O_3 gas and TEOS gas; coating the lateral surface of the groove part (TP) by the insulating film (F1); forming an insulating film (IF2) containing a silicon oxide film by a PECVD method; coating the lateral surface of the groove part (TP) by the insulating film (IF2) as an insulating film (IF1) is interposed; forming an insulating film (IF3) containing a silicon oxide film by a CVD method using gas containing O_3 gas and TEOS gas; and closing the groove part (TP) while leaving a space (SP) within the groove part (TP) by the insulating film (IF3). |
申请公布号 |
KR20150087116(A) |
申请公布日期 |
2015.07.29 |
申请号 |
KR20150007916 |
申请日期 |
2015.01.16 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
MURATA TATSUNORI;MARUYAMA TAKAHIRO |
分类号 |
H01L21/314;H01L21/02;H01L21/205 |
主分类号 |
H01L21/314 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|