发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 The purpose of the present invention is to improve a performance of a semiconductor device, The present invention provides a method for manufacturing a semiconductor device comprising: forming a groove part (TP); forming an insulating film (F1) containing a silicon oxide film by a CVD method using gas containing O_3 gas and TEOS gas; coating the lateral surface of the groove part (TP) by the insulating film (F1); forming an insulating film (IF2) containing a silicon oxide film by a PECVD method; coating the lateral surface of the groove part (TP) by the insulating film (IF2) as an insulating film (IF1) is interposed; forming an insulating film (IF3) containing a silicon oxide film by a CVD method using gas containing O_3 gas and TEOS gas; and closing the groove part (TP) while leaving a space (SP) within the groove part (TP) by the insulating film (IF3).
申请公布号 KR20150087116(A) 申请公布日期 2015.07.29
申请号 KR20150007916 申请日期 2015.01.16
申请人 RENESAS ELECTRONICS CORPORATION 发明人 MURATA TATSUNORI;MARUYAMA TAKAHIRO
分类号 H01L21/314;H01L21/02;H01L21/205 主分类号 H01L21/314
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